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CSN IEC 191-2
Mechanical standardization of semiconductor devices - Part 2: Dimensions
Mechanical standardization of semiconductor devices - Part 2: Dimensions
Released: 01.01.2000
English Hardcopy
In stock
30.00 EUR
English Hardcopy
In stock
42.00 EUR
English Hardcopy
In stock
30.00 EUR
English Hardcopy
In stock
42.00 EUR
CSN EN 61967-6
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
Released: 01.05.2003
English Hardcopy
In stock
42.00 EUR
CSN EN 60749-25
Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling
Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling
Released: 01.06.2004
English Hardcopy
In stock
95.00 EUR
CSN EN 62374
Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films
Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films
Released: 01.05.2008
English Hardcopy
In stock
110.00 EUR
CSN EN 62341-1-1
Organic light emitting diode (OLED) displays - Part 1-1: Generic specifications
Organic light emitting diode (OLED) displays - Part 1-1: Generic specifications
Released: 01.05.2010
English Hardcopy
In stock
95.00 EUR
CSN EN 62373
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Released: 01.03.2007
English Hardcopy
In stock
95.00 EUR
CSN EN 62258-5
Semiconductor die products - Part 5: Requirements for information concerning electrical simulation
Semiconductor die products - Part 5: Requirements for information concerning electrical simulation
Released: 01.06.2007
English Hardcopy
In stock
80.00 EUR
CSN EN 62416
Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010)
Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010)
Released: 01.12.2010
English Hardcopy
In stock
70.00 EUR
CSN EN 61747-5-3
Liquid crystal display devices - Part 5-3: Environmental, endurance and mechanical test methods - Glass strength and reliability
Liquid crystal display devices - Part 5-3: Environmental, endurance and mechanical test methods - Glass strength and reliability
Released: 01.12.2010
English Hardcopy
In stock
95.00 EUR