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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>18/30386543 DC BS EN 63229 Ed.1.0. Semiconductor devices. The classification of defects in gallium nitride epitaxial wafers on silicon carbide substrate
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18/30386543 DC BS EN 63229 Ed.1.0. Semiconductor devices. The classification of defects in gallium nitride epitaxial wafers on silicon carbide substrate

18/30386543 DC

BS EN 63229 Ed.1.0. Semiconductor devices. The classification of defects in gallium nitride epitaxial wafers on silicon carbide substrate

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Standard number:18/30386543 DC
Pages:28
Released:2018-12-11
Status:Draft for Comment
DESCRIPTION

18/30386543 DC


This standard 18/30386543 DC BS EN 63229 Ed.1.0. Semiconductor devices. The classification of defects in gallium nitride epitaxial wafers on silicon carbide substrate is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general
  • 31.080 Semiconductor devices
  • 31.080.99 Other semiconductor devices