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immediate downloadReleased: 2020-04-01
20/30409285 DC
BS IEC 63284. Semiconductor devices. Reliability test method of on-stress reliability by inductive load switching for gallium nitride transistors
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Standard number: | 20/30409285 DC |
Pages: | 13 |
Released: | 2020-04-01 |
Status: | Draft for Comment |
DESCRIPTION
20/30409285 DC
This standard 20/30409285 DC BS IEC 63284. Semiconductor devices. Reliability test method of on-stress reliability by inductive load switching for gallium nitride transistors is classified in these ICS categories:
- 31.080.01 Semiconductor devices in general
- 31.080.99 Other semiconductor devices
- 31.080.30 Transistors