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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>20/30419235 DC BS EN 60749-28. Semiconductor devices. Mechanical and climatic test methods Part 28. Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level
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20/30419235 DC BS EN 60749-28. Semiconductor devices. Mechanical and climatic test methods Part 28. Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level

20/30419235 DC

BS EN 60749-28. Semiconductor devices. Mechanical and climatic test methods Part 28. Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level

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Standard number:20/30419235 DC
Pages:51
Released:2020-11-21
Status:Draft for Comment
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20/30419235 DC


This standard 20/30419235 DC BS EN 60749-28. Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general