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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>20/30423207 DC BS EN IEC 62951-9. Semiconductor devices. Flexible and stretchable semiconductor devices Part 9. Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells
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immediate downloadReleased: 2020-09-11
20/30423207 DC BS EN IEC 62951-9. Semiconductor devices. Flexible and stretchable semiconductor devices Part 9. Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells

20/30423207 DC

BS EN IEC 62951-9. Semiconductor devices. Flexible and stretchable semiconductor devices Part 9. Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells

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Standard number:20/30423207 DC
Pages:19
Released:2020-09-11
Status:Draft for Comment
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20/30423207 DC


This standard 20/30423207 DC BS EN IEC 62951-9. Semiconductor devices. Flexible and stretchable semiconductor devices is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general
  • 31.080.99 Other semiconductor devices