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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>21/30432234 DC BS IEC 60747-18-4. Semiconductor devices Part 18-4. Semiconductor bio sensors. Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
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21/30432234 DC BS IEC 60747-18-4. Semiconductor devices Part 18-4. Semiconductor bio sensors. Evaluation method of noise characteristics of lens-free CMOS photonic array sensors

21/30432234 DC

BS IEC 60747-18-4. Semiconductor devices Part 18-4. Semiconductor bio sensors. Evaluation method of noise characteristics of lens-free CMOS photonic array sensors

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Standard number:21/30432234 DC
Pages:14
Released:2021-05-07
Status:Draft for Comment
DESCRIPTION

21/30432234 DC


This standard 21/30432234 DC BS IEC 60747-18-4. Semiconductor devices is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general
  • 31.080.99 Other semiconductor devices

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