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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.99 Other semiconductor devices>21/30432242 DC BS IEC 62047-42. Semiconductor devices. Micro-electromechanical devices Part 42. Measurement methods of electromechanical conversion characteristics of piezoelectric MEMS cantilever
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immediate downloadReleased: 2021-07-09
21/30432242 DC BS IEC 62047-42. Semiconductor devices. Micro-electromechanical devices Part 42. Measurement methods of electromechanical conversion characteristics of piezoelectric MEMS cantilever

21/30432242 DC

BS IEC 62047-42. Semiconductor devices. Micro-electromechanical devices Part 42. Measurement methods of electromechanical conversion characteristics of piezoelectric MEMS cantilever

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Standard number:21/30432242 DC
Pages:22
Released:2021-07-09
Status:Draft for Comment
DESCRIPTION

21/30432242 DC


This standard 21/30432242 DC BS IEC 62047-42. Semiconductor devices. Micro-electromechanical devices is classified in these ICS categories:
  • 31.080.99 Other semiconductor devices

This product includes: