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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>21/30432536 DC BS EN IEC 63364-1. Semiconductor devices. Semiconductor devices for IOT system Part 1. Test method of sound variation detection
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21/30432536 DC BS EN IEC 63364-1. Semiconductor devices. Semiconductor devices for IOT system Part 1. Test method of sound variation detection

21/30432536 DC

BS EN IEC 63364-1. Semiconductor devices. Semiconductor devices for IOT system Part 1. Test method of sound variation detection

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Standard number:21/30432536 DC
Pages:14
Released:2021-06-18
Status:Draft for Comment
DESCRIPTION

21/30432536 DC


This standard 21/30432536 DC BS EN IEC 63364-1. Semiconductor devices. Semiconductor devices for IOT system is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general