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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>21/30435579 DC BS EN 60749-10. Semiconductor devices. Mechanical and climatic test methods Part 10. Mechanical shock. Device and subassembly
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21/30435579 DC BS EN 60749-10. Semiconductor devices. Mechanical and climatic test methods Part 10. Mechanical shock. Device and subassembly

21/30435579 DC

BS EN 60749-10. Semiconductor devices. Mechanical and climatic test methods Part 10. Mechanical shock. Device and subassembly

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Standard number:21/30435579 DC
Pages:14
Released:2021-05-14
Status:Draft for Comment
DESCRIPTION

21/30435579 DC


This standard 21/30435579 DC BS EN 60749-10. Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general