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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.99 Other semiconductor devices>22/30437195 DC BS IEC 62047-43. Semiconductor devices. Micro-electromechanical devices Part 43. Test method of electrical characteristics after cyclic bending deformation for flexible electro-mechanical devices
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immediate downloadReleased: 2022-02-11
22/30437195 DC BS IEC 62047-43. Semiconductor devices. Micro-electromechanical devices Part 43. Test method of electrical characteristics after cyclic bending deformation for flexible electro-mechanical devices

22/30437195 DC

BS IEC 62047-43. Semiconductor devices. Micro-electromechanical devices Part 43. Test method of electrical characteristics after cyclic bending deformation for flexible electro-mechanical devices

CURRENCY
26 USD
Standard number:22/30437195 DC
Pages:18
Released:2022-02-11
Status:Draft for Comment
DESCRIPTION

22/30437195 DC


This standard 22/30437195 DC BS IEC 62047-43. Semiconductor devices. Micro-electromechanical devices is classified in these ICS categories:
  • 31.080.99 Other semiconductor devices

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