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Released: 2014-07-16
ASTM F1262M-14
Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)
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| Language: | English |
| Released: | 2014-07-16 |
| Pages: | 6 |
| Standards number: | ASTM F1262M-14 |
| Standard number: | F1262M-14 |
| Released: | 01.06.2014 |
| Status: | Active |
| Pages: | 6 |
| Section: | 10.04 |
| Keywords: | digital integrated circuits; digital IC's; functional errors; ionizing; pulsed radiation; radiation; transient radiation; upset threshold |
DESCRIPTION
1.1 This guide is to assist experimenters in measuring the transient radiation upset threshold of silicon digital integrated circuits exposed to pulses of ionizing radiation greater than 103 Gy (matl.)/s.
1.1.1 Discussion—This document is intended to be a guide to determine upset threshold, and is not intended to be a stand-alone document.
1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.