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Homepage>BS Standards>17 METROLOGY AND MEASUREMENT. PHYSICAL PHENOMENA>17.040 Linear and angular measurements>17.040.20 Properties of surfaces>BS EN 14571:2005 Metallic coatings on nonmetallic basis materials. Measurement of coating thickness. Microresistivity method
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immediate downloadReleased: 2005-05-03
BS EN 14571:2005 Metallic coatings on nonmetallic basis materials. Measurement of coating thickness. Microresistivity method

BS EN 14571:2005

Metallic coatings on nonmetallic basis materials. Measurement of coating thickness. Microresistivity method

CURRENCY
LANGUAGE
English
Standard number:BS EN 14571:2005
Pages:14
Released:2005-05-03
ISBN:0 580 45949 7
Status:Standard
DESCRIPTION
This standard BS EN 14571:2005 Metallic coatings on nonmetallic basis materials. Measurement of coating thickness. Microresistivity method is classified in these ICS categories:
  • 25.220.40 Metallic coatings
  • 17.040.20 Properties of surfaces
This standard describes a method for nondestructive measurements of the thickness of conductive coatings on nonconductive base materials. This method is based on the principle of the sheet resistivity measurement and is applicable to any conductive coatings and layers of metal and semiconductor materials. In general, the probe has to be adjusted to the conductivity and the thickness of the respective application. However, this standard is focussing on metallic coatings on nonconductive base materials (e.g. Copper on plastic substrates, printed circuit boards). NOTE 1 This method also applies to the measurement of through-hole copper thickness of printed circuit boards. However, for this application a probe geometry different from the one described in this standard is necessary. NOTE 2 This method is also applicable for thickness measurements of conductive coatings on conductive base materials, if the resistivity of the coating and the base material is different. This case is not considered in this standard.
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