PRICES include / exclude VAT
Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>BS EN 60749-3:2017 Semiconductor devices. Mechanical and climatic test methods External visual examination
Sponsored link
immediate downloadReleased: 2017-11-24
BS EN 60749-3:2017 Semiconductor devices. Mechanical and climatic test methods External visual examination

BS EN 60749-3:2017

Semiconductor devices. Mechanical and climatic test methods External visual examination

Format
Availability
Price and currency
English Secure PDF
Immediate download
195.00 USD
English Hardcopy
In stock
195.00 USD
Standard number:BS EN 60749-3:2017
Pages:18
Released:2017-11-24
ISBN:978 0 580 94893 0
Status:Standard
DESCRIPTION

BS EN 60749-3:2017


This standard BS EN 60749-3:2017 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general

The purpose of this part of IEC 60749 is to verify that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document. External visual inspection is a non-destructive test and applicable for all package types. The test is useful for qualification, process monitor, or lot acceptance.