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Homepage>BS Standards>71 CHEMICAL TECHNOLOGY>71.040 Analytical chemistry>71.040.40 Chemical analysis>BS ISO 11505:2012 Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
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immediate downloadReleased: 2013-01-31
BS ISO 11505:2012 Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry

BS ISO 11505:2012

Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry

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Standard number:BS ISO 11505:2012
Pages:42
Released:2013-01-31
ISBN:978 0 580 77085 2
Status:Standard
DESCRIPTION

BS ISO 11505:2012


This standard BS ISO 11505:2012 Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry is classified in these ICS categories:
  • 71.040.40 Chemical analysis

This International Standard describes a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films.

It is limited to a description of general procedures of quantification of GD-OES and is not applicable directly for the quantification of individual materials having various thicknesses and elements to be determined.

NOTE Any individual standard for a test material will have to specify a scope of a thickness of the surface layer as well as analyte elements, and include results of interlaboratory tests for validation of the methods.