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31.080.01 Semiconductor devices in general
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BS EN 60749-4:2017
Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)
Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)
Released: 2017-11-28
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210.67 USD
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21.07 USD
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63.20 USD
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210.67 USD
BS EN 60191-6-10:2003
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of surface mounted semiconductor device packages
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of surface mounted semiconductor device packages
Released: 2004-03-31
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210.67 USD
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21.07 USD
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63.20 USD
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In stock
210.67 USD
English Secure PDF
Immediate download
210.67 USD
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
21.07 USD
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63.20 USD
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210.67 USD
BS EN 60749-1:2003
Semiconductor devices. Mechanical and climatic test methods General
Semiconductor devices. Mechanical and climatic test methods General
Released: 2003-07-07
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178.67 USD
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17.87 USD
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53.60 USD
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178.67 USD
PD IEC/TR 63133:2017
Semiconductor devices. Scan based ageing level estimation for semiconductor devices
Semiconductor devices. Scan based ageing level estimation for semiconductor devices
Released: 2018-01-29
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210.67 USD
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21.07 USD
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63.20 USD
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210.67 USD
BS EN 60749-40:2011
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using a strain gauge
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using a strain gauge
Released: 2011-09-30
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293.33 USD
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29.33 USD
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88.00 USD
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293.33 USD
BS EN IEC 60749-20:2020
Semiconductor devices. Mechanical and climatic test methods Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
Semiconductor devices. Mechanical and climatic test methods Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
Released: 2020-10-14
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293.33 USD
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29.33 USD
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88.00 USD
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293.33 USD
BS EN IEC 60749-41:2020
Semiconductor devices. Mechanical and climatic test methods Standard reliability testing methods of non-volatile memory devices
Semiconductor devices. Mechanical and climatic test methods Standard reliability testing methods of non-volatile memory devices
Released: 2020-09-09
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293.33 USD
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29.33 USD
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88.00 USD
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293.33 USD
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26.67 USD
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26.67 USD
BS EN IEC 60749-28:2022
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). device level
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). device level
Released: 2022-09-06
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408.00 USD
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40.80 USD
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122.40 USD
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408.00 USD
BS EN IEC 60749-10:2022 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Mechanical shock. device and subassembly
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Mechanical shock. device and subassembly
Released: 2022-09-15
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296.00 USD
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296.00 USD
BS IEC 60747-5-4:2022
Semiconductor devices Optoelectronic devices. Semiconductor lasers
Semiconductor devices Optoelectronic devices. Semiconductor lasers
Released: 2022-06-20
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344.00 USD
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34.40 USD
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Reading the standardfor 24 hours
103.20 USD
English Hardcopy
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344.00 USD