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31.080.01 Semiconductor devices in general
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BS EN IEC 60068-2-13:2021
Environmental testing Tests. Test M: Low air pressure
Environmental testing Tests. Test M: Low air pressure
Released: 2021-04-26
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195.00 USD
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195.00 USD
BS EN IEC 60191-1:2018
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of discrete devices
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of discrete devices
Released: 2018-04-30
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317.20 USD
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317.20 USD
BS EN IEC 60747-16-6:2019
Semiconductor devices Microwave integrated circuits. Frequency multipliers
Semiconductor devices Microwave integrated circuits. Frequency multipliers
Released: 2019-09-02
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270.40 USD
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270.40 USD
BS EN IEC 60747-5-5:2020
Semiconductor devices Optoelectronic devices. Photocouplers
Semiconductor devices Optoelectronic devices. Photocouplers
Released: 2020-09-17
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377.00 USD
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377.00 USD
BS EN IEC 60749-10:2022 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Mechanical shock. device and subassembly
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Mechanical shock. device and subassembly
Released: 2022-09-15
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254.80 USD
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254.80 USD
BS EN IEC 60749-10:2022
Semiconductor devices. Mechanical and climatic test methods Mechanical shock. device and subassembly
Semiconductor devices. Mechanical and climatic test methods Mechanical shock. device and subassembly
Released: 2022-08-16
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BS EN IEC 60749-12:2018
Semiconductor devices. Mechanical and climatic test methods Vibration, variable frequency
Semiconductor devices. Mechanical and climatic test methods Vibration, variable frequency
Released: 2018-04-18
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163.80 USD
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163.80 USD
BS EN IEC 60749-13:2018
Semiconductor devices. Mechanical and climatic test methods Salt atmosphere
Semiconductor devices. Mechanical and climatic test methods Salt atmosphere
Released: 2018-04-30
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BS EN IEC 60749-15:2020
Semiconductor devices. Mechanical and climatic test methods Resistance to soldering temperature for through-hole mounted devices
Semiconductor devices. Mechanical and climatic test methods Resistance to soldering temperature for through-hole mounted devices
Released: 2020-10-01
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195.00 USD
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195.00 USD
BS EN IEC 60749-17:2019 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Released: 2020-02-24
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213.20 USD
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213.20 USD
BS EN IEC 60749-17:2019
Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Released: 2019-05-15
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163.80 USD
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163.80 USD
BS EN IEC 60749-18:2019 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
Released: 2020-11-03
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353.60 USD
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353.60 USD
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353.60 USD
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353.60 USD