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BS ISO 21270:2004
Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
Released: 2005-03-31
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BS ISO 22048:2004
Surface chemical analysis. Information format for static secondary-ion mass spectrometry
Surface chemical analysis. Information format for static secondary-ion mass spectrometry
Released: 2005-03-31
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BS ISO 22415:2019
Surface chemical analysis. Secondary ion mass spectrometry. Method for determining yield volume in argon cluster sputter depth profiling of organic materials
Surface chemical analysis. Secondary ion mass spectrometry. Method for determining yield volume in argon cluster sputter depth profiling of organic materials
Released: 2019-05-14
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259.76 USD
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BS ISO 23812:2009
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth calibration for silicon using multiple delta-layer reference materials
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth calibration for silicon using multiple delta-layer reference materials
Released: 2009-05-31
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BS ISO 23830:2008
Surface chemical analysis. Secondary-ion mass spectrometry. Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
Surface chemical analysis. Secondary-ion mass spectrometry. Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
Released: 2008-12-31
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BS ISO 24236:2005
Surface chemical analysis. Auger electron spectroscopy. Repeatability and constancy of intensity scale
Surface chemical analysis. Auger electron spectroscopy. Repeatability and constancy of intensity scale
Released: 2005-05-12
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BS ISO 24237:2005
Surface chemical analysis. X-ray photoelectron spectroscopy. Repeatability and constancy of intensity scale
Surface chemical analysis. X-ray photoelectron spectroscopy. Repeatability and constancy of intensity scale
Released: 2005-09-11
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BS ISO 27911:2011
Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
Released: 2011-08-31
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BS ISO 28600:2011
Surface chemical analysis. Data transfer format for scanning-probe microscopy
Surface chemical analysis. Data transfer format for scanning-probe microscopy
Released: 2011-07-31
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BS ISO 29081:2010
Surface chemical analysis. Auger electron spectroscopy. Reporting of methods used for charge control and charge correction
Surface chemical analysis. Auger electron spectroscopy. Reporting of methods used for charge control and charge correction
Released: 2010-02-28
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BS ISO 6145-2:2014
Gas analysis. Preparation of calibration gas mixtures using dynamic methods Piston pumps
Gas analysis. Preparation of calibration gas mixtures using dynamic methods Piston pumps
Released: 2014-07-31
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