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71.040.40 Chemical analysis
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88.00 USD
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BS ISO 23812:2009
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth calibration for silicon using multiple delta-layer reference materials
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth calibration for silicon using multiple delta-layer reference materials
Released: 2009-05-31
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88.00 USD
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BS ISO 12406:2010
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon
Released: 2010-11-30
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BS ISO 29081:2010
Surface chemical analysis. Auger electron spectroscopy. Reporting of methods used for charge control and charge correction
Surface chemical analysis. Auger electron spectroscopy. Reporting of methods used for charge control and charge correction
Released: 2010-02-28
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BS ISO 12963:2017+A1:2020
Gas analysis. Comparison methods for the determination of the composition of gas mixtures based on one- and two-point calibration
Gas analysis. Comparison methods for the determination of the composition of gas mixtures based on one- and two-point calibration
Released: 2021-01-08
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PD ISO/TR 15969:2021
Surface chemical analysis. Depth profiling. Measurement of sputtered depth
Surface chemical analysis. Depth profiling. Measurement of sputtered depth
Released: 2021-03-26
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BS ISO 19318:2021
Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
Released: 2021-06-16
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