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PD ISO/TR 18394:2016
Surface chemical analysis. Auger electron spectroscopy. Derivation of chemical information
Surface chemical analysis. Auger electron spectroscopy. Derivation of chemical information
Released: 2016-05-31
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34.40 USD
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103.20 USD
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344.00 USD
BS EN ISO 6145-7:2018
Gas analysis. Preparation of calibration gas mixtures using dynamic methods Thermal mass-flow controllers
Gas analysis. Preparation of calibration gas mixtures using dynamic methods Thermal mass-flow controllers
Released: 2019-01-04
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21.07 USD
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63.20 USD
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BS EN 17298:2019
Animal feeding stuffs. Methods of sampling and analysis. Determination of benzoic and sorbic acid by High Performance Liquid Chromatography (HPLC)
Animal feeding stuffs. Methods of sampling and analysis. Determination of benzoic and sorbic acid by High Performance Liquid Chromatography (HPLC)
Released: 2019-08-16
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21.07 USD
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63.20 USD
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BS ISO 14707:2021
Surface chemical analysis. Glow discharge optical emission spectrometry (GD-OES). Introduction to use
Surface chemical analysis. Glow discharge optical emission spectrometry (GD-OES). Introduction to use
Released: 2021-03-12
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63.20 USD
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293.33 USD
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29.33 USD
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88.00 USD
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BS ISO 18115-2:2021
Surface chemical analysis. Vocabulary Terms used in scanning-probe microscopy
Surface chemical analysis. Vocabulary Terms used in scanning-probe microscopy
Released: 2022-02-02
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408.00 USD
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40.80 USD
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122.40 USD
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BS ISO 16129:2018
Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
Released: 2018-11-19
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293.33 USD
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88.00 USD
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BS ISO 22415:2019
Surface chemical analysis. Secondary ion mass spectrometry. Method for determining yield volume in argon cluster sputter depth profiling of organic materials
Surface chemical analysis. Secondary ion mass spectrometry. Method for determining yield volume in argon cluster sputter depth profiling of organic materials
Released: 2019-05-14
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34.40 USD
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103.20 USD
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BS ISO 17974:2002
Surface chemical analysis. High-resolution Auger electron spectrometers. Calibration of energy scales for elemental and chemical-state analysis
Surface chemical analysis. High-resolution Auger electron spectrometers. Calibration of energy scales for elemental and chemical-state analysis
Released: 2002-11-29
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BS EN ISO 6145-7:2018 - TC
Tracked Changes. Gas analysis. Preparation of calibration gas mixtures using dynamic methods Thermal mass-flow controllers
Tracked Changes. Gas analysis. Preparation of calibration gas mixtures using dynamic methods Thermal mass-flow controllers
Released: 2020-02-24
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BS EN ISO 16664:2017 - TC
Tracked Changes. Gas analysis. Handling of calibration gases and gas mixtures. Guidelines
Tracked Changes. Gas analysis. Handling of calibration gases and gas mixtures. Guidelines
Released: 2020-02-26
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BS ISO 14606:2022 - TC
Tracked Changes. Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
Tracked Changes. Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
Released: 2023-02-17
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