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immediate downloadReleased: 2017-04
DIN EN 60749-41
Semiconductor devices - Mechanical and climatic test methods - Part 41: Reliability testing methods of non-volatile memory devices (IEC 47/2325/CD:2016)
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 41: Zuverlässigkeitsprüfverfahren für nichtflüchtige Speicher-Bauelemente (IEC 47/2325/CD:2016)
CURRENCY
| Status: | Draft |
| Released: | 2017-04 |
| Standard number: | DIN EN 60749-41 |
| Name: | Semiconductor devices - Mechanical and climatic test methods - Part 41: Reliability testing methods of non-volatile memory devices (IEC 47/2325/CD:2016) |
| Pages: | 35 |
DESCRIPTION