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Homepage>IEC Standards>IEC 61967-4:2002+AMD1:2006 CSV - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method
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download between 0-24 hoursReleased: 2006-07-27
IEC 61967-4:2002+AMD1:2006 CSV - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method

IEC 61967-4:2002+AMD1:2006 CSV

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method

Circuits intégrés - Mesure des émissions électromagnétiques, 150 kHz à 1 GHz - Partie 4: Mesure des émissions conduites - Méthode par couplage direct 1 Ω/150 Ω

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Standard number:IEC 61967-4:2002+AMD1:2006 CSV
Released:2006-07-27
Language:English/French - Bilingual
DESCRIPTION

IEC 61967-4:2002+AMD1:2006 CSV

Specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe and RF voltage measurement using a 150 Ω coupling network. These methods guarantee a high degree of repeatability and correlation of EME measurements. IEC 61967-1 specifies general conditions and definitions of the test methods. The contents of the corrigendum 1 of June 2017 have been included in this copy. This consolidated version consists of the first edition (2002) and its amendment 1 (2006). Therefore, no need to order amendment in addition to this publication.

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