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Homepage>IEC Standards>IEC 62884-2:2017 - Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method
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download between 0-24 hoursReleased: 2017-08-30
IEC 62884-2:2017 - Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method

IEC 62884-2:2017

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method

Techniques de mesure des oscillateurs piézoélectriques, diélectriques et électrostatiques - Partie 2 : Méthode de mesure de la gigue de phase

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Standard number:IEC 62884-2:2017
Released:2017-08-30
Language:English
DESCRIPTION

IEC 62884-2:2017

IEC 62884-2:2017 specifies the methods for the measurement and evaluation of the phase jitter measurement of piezoelectric, dielectric and electrostatic oscillators, including dielectric resonator oscillators (DROs) and oscillators using a thin-film bulk acoustic resonator (FBAR) (hereinafter referred to as an "Oscillator") and gives guidance for phase jitter that allows the accurate measurement of RMS jitter. In the measurement method, phase noise measurement equipment or a phase noise measurement system is used. NOTE Dielectric resonator oscillators (DROs) and oscillators using FBAR are under consideration.

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