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Homepage>IEC Standards>IEC 62884-3:2018 - Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods
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download between 0-24 hoursReleased: 2018-03-22
IEC 62884-3:2018 - Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods

IEC 62884-3:2018

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods

Techniques de mesure des oscillateurs piézoélectriques, diélectriques et électrostatiques - Partie 3: Méthode d’essai du vieillissement en fréquence

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English/French - Bilingual
Standard number:IEC 62884-3:2018
Released:2018-03-22
Language:English/French - Bilingual
DESCRIPTION

IEC 62884-3:2018

IEC 62884-3:2018 describes the methods for the measurement and evaluation of frequency aging tests of piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using FBAR (hereinafter referred to as "Oscillator"). The purpose of those tests is to provide statistical data supporting aging predictions. This document was developed from the works related to IEC 60679-1:2007 (third edition), the measurement techniques of which were restructured into different parts under a new project reference. This document describes the measurement method for frequency aging only.