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Homepage>BS Standards>07 MATHEMATICS. NATURAL SCIENCES>07.030 Physics. Chemistry>PD IEC TS 62607-5-3:2020 Nanomanufacturing. Key control characteristics Thin-film organic/nano electronic devices. Measurements of charge carrier concentration
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PD IEC TS 62607-5-3:2020 Nanomanufacturing. Key control characteristics Thin-film organic/nano electronic devices. Measurements of charge carrier concentration

PD IEC TS 62607-5-3:2020

Nanomanufacturing. Key control characteristics Thin-film organic/nano electronic devices. Measurements of charge carrier concentration

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Standard number:PD IEC TS 62607-5-3:2020
Pages:24
Released:2020-04-22
ISBN:978 0 580 99198 1
Status:Standard
DESCRIPTION

PD IEC TS 62607-5-3:2020


This standard PD IEC TS 62607-5-3:2020 Nanomanufacturing. Key control characteristics is classified in these ICS categories:
  • 07.120 Nanotechnologies
  • 07.030 Physics. Chemistry

This part of IEC TS 62607, which is a Technical Specification, specifies sample structures for evaluating a wide range of charge carrier concentration in organic/nano materials. This specification is provided for both capacitance-voltage (C-V) measurements in metal/insulator/semiconductor stacking structures and Hall-effect measurements with the van der Pauw configuration. Criteria for choosing measurement methods of charge carrier concentration in organic semiconductor layers are also given in this document.