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Homepage>BS Standards>35 INFORMATION TECHNOLOGY. OFFICE MACHINES>35.240 Applications of information technology>35.240.70 IT applications in science>18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
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immediate downloadReleased: 2018-06-08
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)

18/30319114 DC

BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)

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Standard number:18/30319114 DC
Pages:46
Released:2018-06-08
Status:Draft for Comment
DESCRIPTION

18/30319114 DC


This standard 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM) is classified in these ICS categories:
  • 35.240.70 IT applications in science
  • 37.020 Optical equipment

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