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Homepage>UNE standards>UNE EN 60191-6-16:2007 Mechanical standardization of semiconductor devices -- Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA (IEC 60191-6-16:2007). (Endorsed by AENOR in October of 2007.)
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in stockReleased: 2007-10-01
UNE EN 60191-6-16:2007 Mechanical standardization of semiconductor devices -- Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA (IEC 60191-6-16:2007). (Endorsed by AENOR in October of 2007.)

UNE EN 60191-6-16:2007

Mechanical standardization of semiconductor devices -- Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA (IEC 60191-6-16:2007). (Endorsed by AENOR in October of 2007.)

Normalización mecánica de dispositivos semiconductores. Parte 6-16: Glosario de ensayo de semiconductor y quemado de soporte para BGA, LGA, FBGA y FLGA. (IEC 60191-6-16:2007). (Ratificada por AENOR en octubre de 2007.)

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Standard number:UNE EN 60191-6-16:2007
Pages:15
Released:2007-10-01
DESCRIPTION

This standard UNE EN 60191-6-16:2007 Mechanical standardization of semiconductor devices -- Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA (IEC 60191-6-16:2007). (Endorsed by AENOR in October of 2007.) is classified in these ICS categories:

  • 31.080.01
Categories:
UNE standards
31.080.01 Semiconductor devices in general
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