Log inSign up
LANGUAGE en
Menu
STOREABOUT US Help centerContactsDelivery chargesNews
SEARCH
0
Total price
0 USD
PRICES include / exclude VAT
Homepage>UNE standards>UNE EN 60747-5-3:2001 Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
Sponsored link
Not available online - contact us!
in stockReleased: 2023-10-02
UNE EN 60747-5-3:2001 Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods

UNE EN 60747-5-3:2001

Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods

Dispositivos discretos de semiconductores y circuitos integrados. Parte 5-3: Dispositivos optoelectrónicos. Métodos de medida. (Ratificada por AENOR en octubre de 2001)

CURRENCY
88 USD
Standard number:UNE EN 60747-5-3:2001
Pages:35
Released:2023-10-02
DESCRIPTION

This standard UNE EN 60747-5-3:2001 Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods is classified in these ICS categories:

  • 31.260
  • 31.080.99
Categories:
UNE standards
31.080.99 Other semiconductor devices
31.260 Optoelectronics. Laser equipment
Print