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Homepage>UNE standards>UNE EN 60749-30:2005 Semiconductor devices - Mechanical and climatic test methods -- Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
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UNE EN 60749-30:2005 Semiconductor devices - Mechanical and climatic test methods -- Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

UNE EN 60749-30:2005

Semiconductor devices - Mechanical and climatic test methods -- Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

Dispositivos semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 30: Preacondicionamiento de dispositivos de montaje superficial no herméticos antes de su ensayo de fiabilidad.

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73.33 USD
Standard number:UNE EN 60749-30:2005
Pages:35
Released:2005-11-02
DESCRIPTION

This standard UNE EN 60749-30:2005 Semiconductor devices - Mechanical and climatic test methods -- Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing is classified in these ICS categories:

  • 31.080.01
Categories:
UNE standards
31.080.01 Semiconductor devices in general
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