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Homepage>UNE standards>UNE EN IEC 60749-15:2020 Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices (Endorsed by Asociación Española de Normalización in November of 2020.)
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in stockReleased: 2020-11-01
UNE EN IEC 60749-15:2020 Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices (Endorsed by Asociación Española de Normalización in November of 2020.)

UNE EN IEC 60749-15:2020

Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices (Endorsed by Asociación Española de Normalización in November of 2020.)

Dispositivos semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 15: Resistencia a la temperatura de soldadura para dispositivos montados con agujeros pasantes. (Ratificada por la Asociación Española de Normalización en noviembre de 2020.)

CURRENCY
LANGUAGE
English
Standard number:UNE EN IEC 60749-15:2020
Pages:18
Released:2020-11-01
DESCRIPTION
This standard UNE EN IEC 60749-15:2020 Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices (Endorsed by Asociación Española de Normalización in November of 2020.) is classified in these ICS categories:
  • 31.080.01
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