Dear customers, all orders for hardcopy versions will be sent on 6th January 2026, we wish you a Merry Christmas and a Happy New Year

Log inSign up
LANGUAGE en
Menu
STOREHelp centerContactsDelivery chargesABOUT US News
SEARCH
0
Total price
0 EUR
PRICES include / exclude VAT
>BSI Standards >81 GLASS AND CERAMICS INDUSTRIES>81.060 Ceramics>81.060.10 Raw materials>BS EN 15991:2011 Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)
Not available online - contact us!
immediate downloadReleased: 2011-02-28
BS EN 15991:2011 Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)

BS EN 15991:2011

Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)

CURRENCY
249.6 EUR
Standard number:BS EN 15991:2011
Pages:32
Released:2011-02-28
ISBN:978 0 580 64180 0
Status:Standard
DESCRIPTION

BS EN 15991:2011


This standard BS EN 15991:2011 Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV) is classified in these ICS categories:
  • 81.060.10 Raw materials

Print