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Homepage>BS Standards>31 ELECTRONICS>31.200 Integrated circuits. Microelectronics>BS EN IEC 62433-6:2020 EMC IC modelling Models of integrated circuits for Pulse immunity behavioural simulation. Conducted Pulse Immunity (ICIM-CPI)
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immediate downloadReleased: 2020-11-11
BS EN IEC 62433-6:2020 EMC IC modelling Models of integrated circuits for Pulse immunity behavioural simulation. Conducted Pulse Immunity (ICIM-CPI)

BS EN IEC 62433-6:2020

EMC IC modelling Models of integrated circuits for Pulse immunity behavioural simulation. Conducted Pulse Immunity (ICIM-CPI)

CURRENCY
LANGUAGE
English
Standard number:BS EN IEC 62433-6:2020
Pages:60
Released:2020-11-11
ISBN:978 0 580 98772 4
Status:Standard
DESCRIPTION
This standard BS EN IEC 62433-6:2020 EMC IC modelling is classified in these ICS categories:
  • 31.200 Integrated circuits. Microelectronics
  • 33.100.10 Emission
IEC 62433-6:2020 describes the extraction flow for deriving an immunity macro-model of an Integrated Circuit (IC) against conducted Electrostatic Discharge (ESD) according to IEC 61000-4-2 and Electrical Fast Transients (EFT) according to IEC 61000-4-4. The model addresses physical damages due to overvoltage, thermal damage and other failure modes. Functional failures can also be addressed. This model allows the immunity simulation of the IC in an application. This model is commonly called "Integrated Circuit Immunity Model Conducted Pulse Immunity", ICIM-CPI. This document provides: - the description of ICIM-CPI macro-model elements representing electrical, thermal or logical behaviour of the IC. - a universal data exchange format based on XML.
This product includes: