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>BSI Standards >71 CHEMICAL TECHNOLOGY>71.040 Analytical chemistry>71.040.40 Chemical analysis>BS ISO 18118:2015 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
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immediate downloadReleased: 2015-04-30
BS ISO 18118:2015 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

BS ISO 18118:2015

Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

CURRENCY
292.8 EUR
Standard number:BS ISO 18118:2015
Pages:38
Released:2015-04-30
ISBN:978 0 580 87880 0
Status:Standard
DESCRIPTION

BS ISO 18118:2015


This standard BS ISO 18118:2015 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials is classified in these ICS categories:
  • 71.040.40 Chemical analysis

This International Standard gives guidance on the measurement and use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials by Auger electron spectroscopy and X-ray photoelectron spectroscopy.


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