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31.140 Piezoelectric and dielectric devices
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24/30503297 DC
BS EN IEC 63541 Lithium tantalate and lithium niobate crystal for surface acoustic wave (SAW) device applications - Specifications and measuring method
BS EN IEC 63541 Lithium tantalate and lithium niobate crystal for surface acoustic wave (SAW) device applications - Specifications and measuring method
Released: 2024-11-01
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24/30505496 DC
BS EN IEC 63041-1 Piezoelectric sensors Part 1: Generic specifications
BS EN IEC 63041-1 Piezoelectric sensors Part 1: Generic specifications
Released: 2024-11-22
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BS EN 60862-1:2015
Surface acoustic wave (SAW) filters of assessed quality Generic specification
Surface acoustic wave (SAW) filters of assessed quality Generic specification
Released: 2015-11-30
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351.90 EUR
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BS IEC 62047-36:2019
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
Released: 2019-04-24
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BS IEC 62047-30:2017
Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
Released: 2017-10-09
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BS EN 60679-4:1998
Quartz crystal controlled oscillators of assessed quality Sectional specification. Capability approval
Quartz crystal controlled oscillators of assessed quality Sectional specification. Capability approval
Released: 1998-05-15
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BS EN 60679-4-1:1998
Quartz crystal controlled oscillators of assessed quality Blank detail specification. Capability approval
Quartz crystal controlled oscillators of assessed quality Blank detail specification. Capability approval
Released: 1998-06-15
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BS EN 60679-1:2017
Piezoelectric, dielectric and electrostatic oscillators of assessed quality Generic specification
Piezoelectric, dielectric and electrostatic oscillators of assessed quality Generic specification
Released: 2017-12-13
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BS EN 168200:1996
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (qualification approval)
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (qualification approval)
Released: 1991-05-31
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BS EN 60122-3:2010
Quartz crystal units of assessed quality Standard outlines and lead connections
Quartz crystal units of assessed quality Standard outlines and lead connections
Released: 2011-02-28
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