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31.140 Piezoelectric and dielectric devices
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BS EN 168200:1996
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (qualification approval)
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (qualification approval)
Released: 1991-05-31
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189.60 EUR
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BS EN IEC 60122-4:2019
Quartz crystal units of assessed quality Crystal units with thermistors
Quartz crystal units of assessed quality Crystal units with thermistors
Released: 2019-03-28
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BS EN 60444-9:2007
Measurement of quartz crystal unit parameters Measurement of spurious resonances of piezoelectric crystal units
Measurement of quartz crystal unit parameters Measurement of spurious resonances of piezoelectric crystal units
Released: 2007-05-31
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BS EN 61019-2:2005
Surface acoustic wave (SAW) resonators Guide to the use
Surface acoustic wave (SAW) resonators Guide to the use
Released: 2005-10-18
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264.00 EUR
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BS EN 50324-2:2002
Piezoelectric properties of ceramic materials and components Methods of measurement. Low power
Piezoelectric properties of ceramic materials and components Methods of measurement. Low power
Released: 2002-10-10
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BS EN 50324-3:2002
Piezoelectric properties of ceramic materials and components Methods of measurement. High power
Piezoelectric properties of ceramic materials and components Methods of measurement. High power
Released: 2002-10-10
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BS IEC 62047-36:2019
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
Released: 2019-04-24
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BS EN 60679-4:1998
Quartz crystal controlled oscillators of assessed quality Sectional specification. Capability approval
Quartz crystal controlled oscillators of assessed quality Sectional specification. Capability approval
Released: 1998-05-15
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BS EN 60679-4-1:1998
Quartz crystal controlled oscillators of assessed quality Blank detail specification. Capability approval
Quartz crystal controlled oscillators of assessed quality Blank detail specification. Capability approval
Released: 1998-06-15
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160.80 EUR
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BS EN 60679-1:2017
Piezoelectric, dielectric and electrostatic oscillators of assessed quality Generic specification
Piezoelectric, dielectric and electrostatic oscillators of assessed quality Generic specification
Released: 2017-12-13
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BS EN 60122-1:2002+A1:2018
Quartz crystal units of assessed quality Generic specification
Quartz crystal units of assessed quality Generic specification
Released: 2018-05-21
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348.00 EUR
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348.00 EUR
BS IEC 62047-30:2017
Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
Released: 2017-10-09
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