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>BSI Standards >31 ELECTRONICS>31.140 Piezoelectric and dielectric devices>DD IEC/PAS 60679-6:2008 Quartz crystal controlled oscillators of assessed quality Phase jitter measurement method for quartz crystal oscillators and SAW oscillators. Application guide
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immediate downloadReleased: 2008-05-30
DD IEC/PAS 60679-6:2008 Quartz crystal controlled oscillators of assessed quality Phase jitter measurement method for quartz crystal oscillators and SAW oscillators. Application guide

DD IEC/PAS 60679-6:2008

Quartz crystal controlled oscillators of assessed quality Phase jitter measurement method for quartz crystal oscillators and SAW oscillators. Application guide

CURRENCY
180 EUR
Standard number:DD IEC/PAS 60679-6:2008
Pages:22
Released:2008-05-30
ISBN:978 0 580 62340 0
Status:Standard
DESCRIPTION

DD IEC/PAS 60679-6:2008


This standard DD IEC/PAS 60679-6:2008 Quartz crystal controlled oscillators of assessed quality is classified in these ICS categories:
  • 31.140 Piezoelectric devices
IEC/PAS 60679-6 applies to the phase jitter measurement of quartz crystal oscillators and SAW oscillators used for electronic devices and gives guidance for phase jitter that allows the accurate measurement of r.m.s. jitter.
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