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>IEC Standards>IEC 60749-23:2004/AMD1:2011 - Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
immediate downloadReleased: 2011-01-27
IEC 60749-23:2004/AMD1:2011 - Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

IEC 60749-23:2004/AMD1:2011

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

Amendement 1 - Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 23: Durée de vie en fonctionnement à haute température

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English/French - Bilingual PDF
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10.80 EUR
English/French - Bilingual Hardcopy
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10.80 EUR
Standard number:IEC 60749-23:2004/AMD1:2011
Released:2011-01-27
Edition:1
ICS:31.080.01
Pages (English/French - Bilingual):5
ISBN (English/French - Bilingual):9782889123346
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IEC 60749-23:2004/AMD1:2011

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