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Homepage>IEC Standards>IEC 61000-4-34:2005+AMD1:2009+AMD2:2025 CSV - Electromagnetic compatibility (EMC) - Part 4-34: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with mains current more than 16 A per phase
download between 0-24 hoursReleased: 2025-08-07
IEC 61000-4-34:2005+AMD1:2009+AMD2:2025 CSV - Electromagnetic compatibility (EMC) - Part 4-34: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with mains current more than 16 A per phase

IEC 61000-4-34:2005+AMD1:2009+AMD2:2025 CSV

Electromagnetic compatibility (EMC) - Part 4-34: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with mains current more than 16 A per phase

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Standard number:IEC 61000-4-34:2005+AMD1:2009+AMD2:2025 CSV
Released:2025-08-07
Edition:1.2
ICS:33.100.20
Pages (English):69
ISBN (English):9782832706459
DESCRIPTION

IEC 61000-4-34:2005+AMD1:2009+AMD2:2025 CSV

IEC 61000-4-34:2005+AMD1:2009+AMD2:2025 CSV defines the immunity test methods and range of preferred test levels for electrical and electronic equipment connected to low-voltage power supply networks for voltage dips, short interruptions, and voltage variations. This standard applies to electrical and electronic equipment having a rated input current exceeding 16 A per phase. It covers equipment installed in residential areas as well as industrial machinery, specifically voltage dips and short interruptions for equipment connected to either 50 Hz or 60 Hz a.c. networks, including 1-phase and 3-phase mains. The object of this standard is to establish a common reference for evaluating the immunity of electrical and electronic equipment when subjected to voltage dips, short interruptions and voltage variations. The test method documented in this part of IEC 61000 describes a consistent method to assess the immunity of equipment or a system against a defined phenomenon. It has the status of a Basic EMC Publication in accordance with IEC Guide 107.