Don't have a credit card? Never mind we support BANK TRANSFER .

Log inSign up
LANGUAGE en
Menu
STOREHelp centerContactsDelivery chargesABOUT US News
SEARCH
0
Total price
0 EUR
PRICES include / exclude VAT
>ISO Standards>ISO 16700:2016-Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification
immediate downloadReleased: 2016
ISO 16700:2016-Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification

ISO 16700:2016

ISO 16700:2016-Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification

Format
Availability
Price and currency
English PDF
Immediate download
Printable
150.00 EUR
English Hardcopy
In stock
150.00 EUR
Standard´s number:ISO 16700:2016
Pages:18
Edition:2
Released:2016
Language:English
DESCRIPTION

ISO 16700:2016


ISO 16700:2016 specifies a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material. This method is limited to magnifications determined by the available size range of structures in the calibrating reference material. It does not apply to the dedicated critical dimension measurement SEM.
Print