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Homepage>ISO Standards>ISO 17297:2025-Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary
immediate downloadReleased: 2025
ISO 17297:2025-Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary

ISO 17297:2025

ISO 17297:2025-Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary

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Standard´s number:ISO 17297:2025
Pages:14
Edition:1
Released:2025
Language:English
DESCRIPTION

ISO 17297:2025


This document defines the most commonly used terms for transmission electron microscopy (TEM) specimen preparation using focused ion beam (FIB).
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