Don't have a credit card? Never mind we support BANK TRANSFER .

Log inSign up
LANGUAGE en
Menu
STOREHelp centerContactsDelivery chargesABOUT US News
SEARCH
0
Total price
0 EUR
PRICES include / exclude VAT
Homepage>ISO Standards>ISO 17297:2025-Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary
download between 0-24 hoursReleased: 2025
ISO 17297:2025-Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary

ISO 17297:2025

ISO 17297:2025-Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary

Format
Availability
Price and currency
English PDF
Immediate download
115.00 EUR
English Hardcopy
In stock
115.00 EUR
Standard´s number:ISO 17297:2025
Pages:14
Edition:1
Released:2025
Language:English
Pages (English):14
DESCRIPTION

ISO 17297:2025


This document defines the most commonly used terms for transmission electron microscopy (TEM) specimen preparation using focused ion beam (FIB).
Print