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download between 0-24 hoursReleased: 2020
ISO 22278:2020
ISO 22278:2020-Fine ceramics (advanced ceramics, advanced technical ceramics)-Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam
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| Standard´s number: | ISO 22278:2020 |
| Pages: | 29 |
| Edition: | 1 |
| Released: | 2020 |
| Language: | English |
DESCRIPTION
ISO 22278:2020
This document specifies the test method for measuring the crystalline quality of single-crystal thin film (wafer) using the XRD method with parallel X-ray beam. This document is applicable to all of the single-crystal thin film (wafer) as bulk or epitaxial layer structure.