BS ENISO 10360-11. Geometrical product specifications (GPS). Acceptance and reverification tests for coordinate measuring systems (CMS) Part 11. CMSs using the principle of X-ray computed tomography (CT)
|Standard number:||21/30378338 DC|
|Status:||Draft for Comment|
This standard 21/30378338 DC BS ENISO 10360-11. Geometrical product specifications (GPS). Acceptance and reverification tests for coordinate measuring systems (CMS) is classified in these ICS categories:
- 17.040.40 Geometrical Product Specification (GPS)
- 17.040.30 Measuring instruments
The purpose of this document is to define metrological characteristics and methods for testing CMSs that use the principle of CT (based on X-ray attenuation contrast) as a single sensor and which are dedicated to dimensional measurements of technical workpieces. This excludes medical imaging, medical dimensional measurements and native non-destructive (material) testing applications of CT (e.g. defect analyses). The intention of this document is to achieve – where possible – comparability with the metrological characteristics of CMSs employing tactile probes and/or optical sensors.
CMSs which use sensors other than CT are covered by this document if such sensors are used for setting up and preparing measurements for which CT is used, only.
CMSs which use other sensors together with CT to perform measurements can be specified and tested using ISO 10360-9.
This document covers CMSs which use CT as a measurement technology and which employ various hardware configurations (Annex A) and different scanning modes (Annex B). This document defines metrological characteristics and methods for testing maximum permissible errors (MPEs) that are intended specifically for non-gradient, homogeneous mono-materials, i.e. measurements of reference standards that consist of only one (relevant) material that has no relevant lateral or spatial gradient in the attenuation of X-rays.
This document does not define metrological characteristics or related testing methods that are dedicated to measuring the influence of surface roughness on CT-based CMS measurements or vice-versa (measuring roughness with CT-based CMSs).
For measuring limits of lateral structures below a certain resolution limit, Annex E mentions two types of resolution statements which the manufacturer provided as optional metrological characteristics.
This document establishes the following aspects necessary when using CT:
Reference standards usable as alternatives to gauge blocks (Annex C)
Definition of metrological characteristics for various operating conditions
Notes on the impact on the measurement of, for example, environmental conditions, mathematical data filters and the nature of the measurement standard’s surface