Don't have a credit card? Never mind we support BANK TRANSFER .

Log inSign up
LANGUAGE en
Menu
STOREHelp centerContactsDelivery chargesABOUT US News
SEARCH
0
Total price
0 EUR
PRICES include / exclude VAT
>BSI Standards >31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>24/30497546 DC BS EN IEC 60749-24 Semiconductor devices. Mechanical and climatic test methods Part 24. Accelerated moisture resistance. Unbiased HAST
immediate downloadReleased: 2024-09-06
24/30497546 DC BS EN IEC 60749-24 Semiconductor devices. Mechanical and climatic test methods Part 24. Accelerated moisture resistance. Unbiased HAST

24/30497546 DC

BS EN IEC 60749-24 Semiconductor devices. Mechanical and climatic test methods Part 24. Accelerated moisture resistance. Unbiased HAST

Format
Availability
Price and currency
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
22.40 EUR
English Hardcopy
In stock
22.40 EUR
Standard number:24/30497546 DC
Pages:11
Released:2024-09-06
Status:Draft for Comment
DESCRIPTION

24/30497546 DC


This standard 24/30497546 DC BS EN IEC 60749-24 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general

Print