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31.080.01 Semiconductor devices in general
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PD ES 59008-5-2:2001
Data requirements for semiconductor die. Particular requirements and recommendations for die types Bare die with added connection structures
Data requirements for semiconductor die. Particular requirements and recommendations for die types Bare die with added connection structures
Released: 2001-06-15
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13/30290462 DC
BS EN 60191-1. Mechanical standardization of semiconductor devices. Part 1. General rules for the preparation of outline drawings of discrete devices
BS EN 60191-1. Mechanical standardization of semiconductor devices. Part 1. General rules for the preparation of outline drawings of discrete devices
Released: 2013-09-10
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27.06 USD
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192.12 USD
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BS EN 60749-16:2003
Semiconductor devices. Mechanical and climatic test methods Particle impact noise detection (PIND)
Semiconductor devices. Mechanical and climatic test methods Particle impact noise detection (PIND)
Released: 2004-06-24
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BS QC 750100:1986+A2:1996
Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Sectional specification
Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Sectional specification
Released: 2010-01-31
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192.12 USD
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BS EN 60191-6-19:2010
Mechanical standardization of semiconductor devices Measurement methods of the package warpage at elevated temperature and the maximum permissible warpage
Mechanical standardization of semiconductor devices Measurement methods of the package warpage at elevated temperature and the maximum permissible warpage
Released: 2010-06-30
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BS IEC 60747-14-1:2010
Semiconductor devices Semiconductor sensors. Generic specification for sensors
Semiconductor devices Semiconductor sensors. Generic specification for sensors
Released: 2010-04-30
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BS EN 60749-25:2003
Semiconductor devices. Mechanical and climatic test methods Temperature cycling
Semiconductor devices. Mechanical and climatic test methods Temperature cycling
Released: 2003-10-30
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BS EN 60749-6:2017
Semiconductor devices. Mechanical and climatic test methods Storage at high temperature
Semiconductor devices. Mechanical and climatic test methods Storage at high temperature
Released: 2017-11-24
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BS EN 60749-38:2008
Semiconductor devices. Mechanical and climatic test methods Soft error test method for semiconductor devices with memory
Semiconductor devices. Mechanical and climatic test methods Soft error test method for semiconductor devices with memory
Released: 2008-06-30
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