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31.080.01 Semiconductor devices in general
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25/30461045 DC
Draft BS EN 63464-1 Medical electrical equipment Particular requirements for the basic safety and essential performance of neutron capture therapy equipment
Draft BS EN 63464-1 Medical electrical equipment Particular requirements for the basic safety and essential performance of neutron capture therapy equipment
Released: 2025-11-13
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48.71 USD
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25/30510415 DC
Draft BS EN 63551-5 Semiconductor devices - Detection modules of autonomous land vehicle Part 5: Testing methods of performance for ultrasonic modules
Draft BS EN 63551-5 Semiconductor devices - Detection modules of autonomous land vehicle Part 5: Testing methods of performance for ultrasonic modules
Released: 2025-11-13
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27.06 USD
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25/30510419 DC
Draft BS EN 63551-6 Semiconductor devices - Detection modules of autonomous land vehicle Part 6: Testing methods of performance for visual imaging modules
Draft BS EN 63551-6 Semiconductor devices - Detection modules of autonomous land vehicle Part 6: Testing methods of performance for visual imaging modules
Released: 2025-11-13
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26/30551649 DC
BS EN IEC 60749-29 Semiconductor devices - Mechanical and climatic test methods Part 29: Latch-up test
BS EN IEC 60749-29 Semiconductor devices - Mechanical and climatic test methods Part 29: Latch-up test
Released: 2026-01-30
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27.06 USD
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516.82 USD
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516.82 USD
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313.88 USD
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313.88 USD
PD ES 59008-5-3:2001
Data requirements for semiconductor die. Particular requirements and recommendations for die types Minimally-packaged die
Data requirements for semiconductor die. Particular requirements and recommendations for die types Minimally-packaged die
Released: 2001-12-05
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192.12 USD
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PD ES 59008-6-2:2001
Data requirements for semiconductor die. Exchange data formats and data dictionary Data dictionary
Data requirements for semiconductor die. Exchange data formats and data dictionary Data dictionary
Released: 2001-06-15
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BS EN 60749-31:2003
Semiconductor devices. Mechanical and climatic test methods Flammability of plastic-encapsulated devices (internally induced)
Semiconductor devices. Mechanical and climatic test methods Flammability of plastic-encapsulated devices (internally induced)
Released: 2003-07-04
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192.12 USD
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BS EN 60191-6-16:2007
Mechanical standardization of semiconductor devices Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA
Mechanical standardization of semiconductor devices Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA
Released: 2007-07-31
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BS EN 60749-23:2004+A1:2011
Semiconductor devices. Mechanical and climatic test methods High temperature operating life
Semiconductor devices. Mechanical and climatic test methods High temperature operating life
Released: 2011-06-30
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BS EN 60749-27:2006+A1:2012
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)
Released: 2013-01-31
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224.59 USD
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224.59 USD