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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>BS EN 60749-31:2003 Semiconductor devices. Mechanical and climatic test methods Flammability of plastic-encapsulated devices (internally induced)
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BS EN 60749-31:2003 Semiconductor devices. Mechanical and climatic test methods Flammability of plastic-encapsulated devices (internally induced)

BS EN 60749-31:2003

Semiconductor devices. Mechanical and climatic test methods Flammability of plastic-encapsulated devices (internally induced)

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Standard number:BS EN 60749-31:2003
Pages:8
Released:2003-07-04
ISBN:0 580 42200 3
Status:Standard
DESCRIPTION

BS EN 60749-31:2003


This standard BS EN 60749-31:2003 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
  • 33.180.20 Fibre optic interconnecting devices
  • 31.080.01 Semiconductor devices in general
Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads. The contents of the corrigendum of August 2003 have been included in this copy.