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31.080.01 Semiconductor devices in general
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BS IEC 60747-14-5:2010
Semiconductor devices Semiconductor sensors. PN-junction semiconductor temperature sensor
Semiconductor devices Semiconductor sensors. PN-junction semiconductor temperature sensor
Released: 2010-04-30
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224.59 USD
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BS EN 60749-7:2011
Semiconductor devices. Mechanical and climatic test methods Internal moisture content measurement and the analysis of other residual gases
Semiconductor devices. Mechanical and climatic test methods Internal moisture content measurement and the analysis of other residual gases
Released: 2011-09-30
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BS IEC 60747-18-3:2019
Semiconductor devices Semiconductor bio sensors. Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system
Semiconductor devices Semiconductor bio sensors. Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system
Released: 2020-01-14
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313.88 USD
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BS IEC 60747-19-1:2019
Semiconductor devices Smart sensors. Control scheme of smart sensors
Semiconductor devices Smart sensors. Control scheme of smart sensors
Released: 2019-11-29
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BS EN IEC 60747-16-6:2019
Semiconductor devices Microwave integrated circuits. Frequency multipliers
Semiconductor devices Microwave integrated circuits. Frequency multipliers
Released: 2019-09-02
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BS EN IEC 60749-18:2019
Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
Released: 2019-06-10
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BS EN IEC 60749-13:2018
Semiconductor devices. Mechanical and climatic test methods Salt atmosphere
Semiconductor devices. Mechanical and climatic test methods Salt atmosphere
Released: 2018-04-30
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BS EN 62374-1:2010
Semiconductor devices Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
Semiconductor devices Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
Released: 2011-06-30
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BS EN 60191-4:2014+A1:2018
Mechanical standardization of semiconductor devices Coding system and classification into forms of package outlines for semiconductor device packages
Mechanical standardization of semiconductor devices Coding system and classification into forms of package outlines for semiconductor device packages
Released: 2018-05-30
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BS EN IEC 60749-26:2018
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
Released: 2018-04-30
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435.65 USD
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BS 3934-5:1997
Mechanical standardization of semiconductor devices Recommendations applying to tape automated bonding (TAB) of integrated circuits
Mechanical standardization of semiconductor devices Recommendations applying to tape automated bonding (TAB) of integrated circuits
Released: 1997-09-15
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368.00 USD
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