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31.080.01 Semiconductor devices in general
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26/30544424 DC
Draft BS EN 62047-59 Ed.1.0 Micro-electromechanical systems Part 59: Test methods for performances of MEMS multi-orifice balanced differential pressure flowmeter
Draft BS EN 62047-59 Ed.1.0 Micro-electromechanical systems Part 59: Test methods for performances of MEMS multi-orifice balanced differential pressure flowmeter
Released: 2026-02-11
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26.82 USD
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26.82 USD
BS EN IEC 60749-22-1:2026
Semiconductor devices — Mechanical and climatic test methods Bond strength — wire bond pull test methods
Semiconductor devices — Mechanical and climatic test methods Bond strength — wire bond pull test methods
Released: 2026-01-21
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431.86 USD
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BS EN IEC 60749-17:2019
Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Released: 2019-05-15
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190.45 USD
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BS IEC 60747-14-4:2011
Semiconductor devices. Discrete devices Semiconductor accelerometers
Semiconductor devices. Discrete devices Semiconductor accelerometers
Released: 2011-02-28
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466.73 USD
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466.73 USD
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222.64 USD
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BS EN 60749-8:2003
Semiconductor devices. Mechanical and climatic test methods Sealing
Semiconductor devices. Mechanical and climatic test methods Sealing
Released: 2003-07-03
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BS EN 60749-2:2002
Semiconductor devices. Mechanical and climatic test methods Low air pressure
Semiconductor devices. Mechanical and climatic test methods Low air pressure
Released: 2002-09-24
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BS EN 62298-3:2005
Teleweb application Superteletext profile
Teleweb application Superteletext profile
Released: 2005-10-14
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466.73 USD
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466.73 USD
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190.45 USD
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BS EN 62007-2:2009
Semiconductor optoelectronic devices for fibre optic system applications Measuring methods
Semiconductor optoelectronic devices for fibre optic system applications Measuring methods
Released: 2009-10-31
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364.80 USD
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364.80 USD
BS EN 61582:2006
Radiation protection instrumentation. In vivo counters. Classification, general requirements and test procedures for portable, transportable and installed equipment
Radiation protection instrumentation. In vivo counters. Classification, general requirements and test procedures for portable, transportable and installed equipment
Released: 2006-06-30
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BS IEC 62615:2010
Electrostatic discharge sensitivity testing. Transmission line pulse (TLP). Component level
Electrostatic discharge sensitivity testing. Transmission line pulse (TLP). Component level
Released: 2011-07-31
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311.15 USD
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