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31.080.01 Semiconductor devices in general
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BS EN 62779-2:2016
Semiconductor devices. Semiconductor interface for human body communication Characterization of interfacing performances
Semiconductor devices. Semiconductor interface for human body communication Characterization of interfacing performances
Released: 2016-06-30
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222.64 USD
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222.64 USD
BS IEC 796-1:1990
Microprocessor system bus. 8-bit and 16-bit data MULTIBUS I Functional description with electrical and timing specifications
Microprocessor system bus. 8-bit and 16-bit data MULTIBUS I Functional description with electrical and timing specifications
Released: 1991-02-28
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410.40 USD
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410.40 USD
BS EN 60749-33:2004
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased autoclave
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased autoclave
Released: 2004-06-22
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190.45 USD
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190.45 USD
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364.80 USD
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364.80 USD
BS IEC 62047-29:2017
Semiconductor devices. Micro-electromechanical devices Electromechanical relaxation test method for freestanding conductive thin-films under room temperature
Semiconductor devices. Micro-electromechanical devices Electromechanical relaxation test method for freestanding conductive thin-films under room temperature
Released: 2018-03-15
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BS EN 60749-32:2003+A1:2010
Semiconductor devices. Mechanical and climatic test methods Flammability of plastic-encapsulated devices (externally induced)
Semiconductor devices. Mechanical and climatic test methods Flammability of plastic-encapsulated devices (externally induced)
Released: 2011-03-31
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190.45 USD
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190.45 USD
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222.64 USD
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BS EN 62779-3:2016
Semiconductor devices. Semiconductor interface for human body communication Functional type and its operational conditions
Semiconductor devices. Semiconductor interface for human body communication Functional type and its operational conditions
Released: 2016-06-30
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BS EN 60749-19:2003+A1:2010
Semiconductor devices. Mechanical and climatic test methods Die shear strength
Semiconductor devices. Mechanical and climatic test methods Die shear strength
Released: 2010-10-31
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190.45 USD
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BS EN 60191-3:2000
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of integrated circuits
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of integrated circuits
Released: 2000-06-15
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431.86 USD
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431.86 USD
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190.45 USD
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190.45 USD
BS EN 60749-22:2003
Semiconductor devices. Mechanical and climatic test methods Bond strength
Semiconductor devices. Mechanical and climatic test methods Bond strength
Released: 2003-07-04
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311.15 USD
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311.15 USD