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immediate downloadReleased: 2009-07-31
BS EN 60749-20-1:2009
Semiconductor devices. Mechanical and climatic test methods Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat
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Standard number: | BS EN 60749-20-1:2009 |
Pages: | 38 |
Released: | 2009-07-31 |
ISBN: | 978 0 580 54601 3 |
Status: | Standard |
DESCRIPTION
BS EN 60749-20-1:2009
This standard BS EN 60749-20-1:2009 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
- 31.080.01 Semiconductor devices in general