Log inSign up
LANGUAGE en
Menu
STOREE-ReadingHelp centerContactsDelivery chargesABOUT US News
SEARCH
0
Total price
0 USD
PRICES include / exclude VAT
Homepage>BS Standards>29 ELECTRICAL ENGINEERING>29.100 Components for electrical equipment>29.100.10 Magnetic components>BS EN 60749-22:2003 Semiconductor devices. Mechanical and climatic test methods Bond strength
Sponsored link
immediate downloadReleased: 2003-07-04
BS EN 60749-22:2003 Semiconductor devices. Mechanical and climatic test methods Bond strength

BS EN 60749-22:2003

Semiconductor devices. Mechanical and climatic test methods Bond strength

Format
Availability
Price and currency
English Secure PDF
Immediate download
270.40 USD
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standard
for 1 hour
27.04 USD
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standard
for 24 hours
81.12 USD
English Hardcopy
In stock
270.40 USD
Standard number:BS EN 60749-22:2003
Pages:24
Released:2003-07-04
ISBN:0 580 42199 6
Status:Standard
DESCRIPTION

BS EN 60749-22:2003


This standard BS EN 60749-22:2003 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
  • 29.100.10 Magnetic components
  • 31.080.01 Semiconductor devices in general
Applicable to semiconductor devices (discrete devices and integrated circuits), this test measures bond strength or determine compliance with specified bond strength requirements. The contents of the corrigendum of August 2003 have been included in this copy.
Print